Texture Analysis of Coated Conductors by Micro-Raman and Synchrotron x-ray Diffraction
- Teresa Puig ,
- Anna Puig Molina ,
- Narcis Mestres ,
- Harm van Seijen ,
- Francesc Alzina ,
- Juan Carlos Gonzalez ,
- Xavier Obradors ,
- H. Graafsma ,
- Alexander Usoskin ,
- H.C. Freyhardt
Mat. Res. Soc. Symp. | , Vol 659
Two novel complementary and non-destructive techniques for texture analysis of YBCO coated conductors are presented. Micro-Raman (μ-Raman) spectroscopy enables an easy analysis of the film homogeneity by determining the distribution of a- and c-oriented grains within the tape with a 1 μm spatial resolution and acquisition times of 5 min/spot. In addition, synchrotron x-ray diffraction analysis in transmission geometry and 2D detectors enables, with acquisition times of 100 ms, simultaneous observation of a- and c- crystallites and in-plane textures of substrates, buffers and superconducting layer. Thus, opening the field of this technique to in-situ analysis of epitaxial growth of coated conductors prepared by ex-situ processes. Results from these two techniques for stainless steel tapes buffered with IBAD-YSZ and coated with PLD-YBCO are analyzed.