Texture Analysis of Coated Conductors by Micro-Raman and Synchrotron x-ray Diffraction

Teresa Puig; Anna Puig Molina; Narcis Mestres; Harm van Seijen; Francesc Alzina; Juan Carlos Gonzalez; Xavier Obradors; H. Graafsma; Alexander Usoskin; H.C. Freyhardt

Texture Analysis of Coated Conductors by Micro-Raman and Synchrotron x-ray Diffraction

Teresa Puig ,
Anna Puig Molina ,
Narcis Mestres ,
Harm van Seijen ,
Francesc Alzina ,
Juan Carlos Gonzalez ,
Xavier Obradors ,
H. Graafsma ,
Alexander Usoskin ,
H.C. Freyhardt

Mat. Res. Soc. Symp. | January 2001 , Vol 659

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Two novel complementary and non-destructive techniques for texture analysis of YBCO coated conductors are presented. Micro-Raman (μ-Raman) spectroscopy enables an easy analysis of the film homogeneity by determining the distribution of a- and c-oriented grains within the tape with a 1 μm spatial resolution and acquisition times of 5 min/spot. In addition, synchrotron x-ray diffraction analysis in transmission geometry and 2D detectors enables, with acquisition times of 100 ms, simultaneous observation of a- and c- crystallites and in-plane textures of substrates, buffers and superconducting layer. Thus, opening the field of this technique to in-situ analysis of epitaxial growth of coated conductors prepared by ex-situ processes. Results from these two techniques for stainless steel tapes buffered with IBAD-YSZ and coated with PLD-YBCO are analyzed.