Emrah Yücelen

À propos

I am the microscopy lead for Microsoft Delft Quantum Lab. My activities are design, execution and coordination of characterization experiments of materials using electrons and X-rays.

I have obtained Ph.D. degree from Technical University of Delft, focusing on characterization of low dimensional structures using advanced electron microscopy techniques. I worked for FEI Electron Optics/Thermo Fisher Scientific as a research scientist between 2007-2018 .

Selected publications:

Quantitative atomic 3-D imaging of single/double sheet graphene structure (opens in new tab)
2D Atomic Mapping of Oxidation States in Transition Metal Oxides by Scanning Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy (opens in new tab)
Phase contrast scanning transmission electron microscopy imaging of light and heavy atoms at the limit of contrast and resolution (opens in new tab)